ARCSpectro-NIR

The ARCspectro NIR Spectrometer A miniature Fourier Transform Spectrometer (FTS) based on innovative MEMS technology for NIR spectroscopy. Product description The ARCspectro-NIR is a family of scanning Fourier Transform Spectrometer (FTS) using a licensed exclusive micro actuator fabricated thanks to modern silicon technology. The so-called MEMS (Micro Electro Mechanical Systems) actuator enables precise and fast scans with one single detector. As a result, the ARCspectro-NIR does not need expensive NIR CCD. The ARCspectro-NIR products family has intrinsically no wavelength range limitations. This makes those spectrometers the only portable spectrometer on the market to be capable of measuring from the visible to the near infrared in one shot with a single device (contrary to grating spectrometers). Also the Arcspectro-NIR does not suffer from second or third order gohst spectral contributions. Models of the ARCspectro-NIR Series: The ARCspectro-NIR products family offers a variety of spectrometers having different detectors type: two-color detectors (Si-InGaAs photodiode), Silicon-pin photodiodes, InGaAs-pin photodiodes (cooled and non-cooled). Therefore, we supply a vast choice of instruments. Even more, we can fit the detector to your needs. Models NIR 0.8-1.7 NIR 0.8-2.6 NIR 0.5-1.7 NIR 0.5-2.6 Spectral Range [nm] 800-1700 800-2600 500-1700 500-2600 Signal-to-Noise (single measurement full detector dynamic used, Ratio between the peak value and bottom value of HeNe Spectrum) > 300:1 > 300:1 > 300:1 > 300:1 Detector Type InGaAs InGaAs Si-InGaAs Si-InGaAs   DOWNLOAD pdf description General Specs table (valid for all the models described above): Features ARCspectro V-NIR Spectral resolution at: 500nm 1000nm 1700nm 2600nm 0.7nm 4nm 12nm 27nm Absolute Wavelength accuracy < 0.5nm Relative Wavelength accuracy (repetability) < 0.01nm Measurement Time 2.5 ms Optical Fiber Connector SMA 905 Optical entrance 100 mm Sampling Rate 2 MHz A/D Converter 16 bit Operating Voltage 5V (USB powered) Operating temperature 10°C-30°C Entrance aperture 100 mm (fiber Diam.) Communication Interface USB 2.0 Software Interface Windows XP Product Dimensions (including electronics) 16cm x 11cm x11cm Product Weight 630 g   Software The ARCspectro-NIR series is delivered with a free windows XP,98,2000, compatible program. The software recognize automatically the spectrometer (USB plug and play system) and is able as other conventional spectrometer software to: Display real time spectral measurement results Configure measurement parameters (integration time, averaging). Choose Transmission or Reflection mode Usual features such as save, open, zoom, rescale... Some specific features related to Fourier transform spectrometry: choose apodization (automatic recognition option), look and save the interferograms. On demand application specific features can be implemented in the program within a few weeks. Visit our custom software page. Also free Labview Vi's for driving the spectrometer are available on demand.   Features and benefits MEMS technology: MEMS technology allows reliable, high quality, robust, maintenance-free operation and low power consumption. Thanks to batch processing, the ARCspectro-NIR products family has a high potential for cost-effective & large volumes fabrication. Lamellar Grating Interferometer principle: For the first time ever, this particular spectroscopic principle has been applied into the ARCspectro-NIR products family. As a result, we benefit from the advantages of scanning Fourier spectrometers (compared to grating spectrometers) without the disadvantages of miniaturized Fourier spectrometers, that is: a/ the ARCspectro-NIR products family does not need a beamsplitter, b/ it features a highly reliable innovative scanning system. High speed and software compatibility: The ARCspectro-NIR products family features fast scanning devices, high-speed data acquisition and high data transfer via USB 2.0 for real-time measurements. Distinct advantages 1 single photodiode  (no need of CCD): Single photodiode instead of a CCD line leads to low noise and cost-effective detection solutions, particularly in the near-IR. The choice of available detectors is much larger than CCD. In addition, it is much easier to dedicate a detector to specific needs. Also there are no defect pixels as it is generally the case for NIR 2.6 mm CCDs. Wide wavelength range: VIS & near-IR (500nm to 2600nm) in one single shot when using our two-color detector (hybrid detector with a Si photodiode mounted over an InGaAs PIN photodiode). No second or third order gohst spectral contributions as it is the case for a grating spectromter, Resolution: In the ARCspectro-NIR products family, the resolution is limited by the maximum scanning range, not by the aperture. Therefore, contrary to grating spectrometers, throughput is not affected by resolution. More cost-effective solutions than ever possible before. Sample spectrum measured with the ArcspectroNIR 0.8-2.6 Spectral analysis in the NIR region is a powerful tool for material characterization and production survey. ArcSpectro NIR works with fiber technology and therfore not very sensitive. Best performances will be achieved with transmission measurements Below some examples of applications that can be measured with the ArcSpectro NIR: Transmission spectrum of a 2mm cuvette filed with petrol: Transmission Spectra of common plastics: Transmission Spectrum of a 1cm thick Silicon slab: How does it work ? The ARCspectro V-NIR products family uses the so-called Lamellar Grating Interferometer. The Lamellar Grating Interferometer is a grating having a variable depth. Contrary to the Michelson interferometer, which splits the amplitude at the beamsplitter, the Lamellar Grating Interferometer splits the wavefront at the grating and, consequently, does not need a beamsplitter. By using MEMS technology, we have been able to build the first truly portable, handheld scanning Fourier Transform Spectrometer, which makes the ARCspectro V-NIR products family unrivaled.   What is MEMS technology? Micro Electro Mechanical Systems (MEMS) is the art of silicon micro-machining. It includes a variety of devices. After MEMS components have been built and used as sensors for chemical and physical signals, pumps, motors, and much more, the integration of optics, or the use of MEMS in combination with optical signals has considerably grown in the last years. MEMS technology is compatible with integrated circuit technology and therefore allows batch processing. This makes MEMS highly attractive. ARCoptix large expertise in micro-systems includes the integration of optical functionalities with MEMS in order to achieve high-end optical systems and sensors. Why using MEMS technology? The fabrication of MEMS uses technologies that are now state-of-the art in semiconductors, leading to miniaturization, reliability, precision and high volume productions. Thanks to our longstanding experience in silicon micromachining, we are able to provide advanced solutions for VIS and near-IR spectroscopy.   Advantages of a Fourier Transfrom Spectrometer (FTS): Throughput Advantage: A Fourier Transform spectrometer (FTS) does not use a slit (or glass fiber) to limit the individual frequency reaching the sample and detector as a grating spectrometer does. Overall, more energy reaches the sample and hence the detector in an FTS than in a dispersive spectrometer. This means, for a comparable source and total integration time (sum of all the single measurement for the scanning FTS), that the signal-to-noise ratio of a spectrum measured on an FTS is higher than the signal-to-noise ratio attained on a grating spectrometer . Multiplex advantage: A scanning FTS basically measure an interferogram on a photodiode over time and calculates its Fourier transform to find the spectrum. Every single measurement point that measure the interferogram contains information of each wavelength of the light being measured. In contrast to a dispersive (or grating spectrometer) where a pixel contains only (and the whole) information of a single wavelength. So for a small band spectrum (laser line) only one or two pixels will contribute to the spectrum in a grating spectrometer. In a FTS every measurement (interferogram) will contribute to the final spectrum and we will theoretically get a better signal to noise ratio equal to the root mean square of the number of measurement with the photo-diode that records the interferogram. Notice that this advantage is not valid anymore if broadband spectra without emission or absorption lines are considered. Precision Advantage: For similar reasons  mentioned for the multiplex advantage, the FTS is capable to determined the position of a peak (absorption or emission line) with much more precision than a grating spectrometer. Indeed, in the dispersive the precision is limited by the covered spectral divided by the number of pixels. In a FTS information of the emission or absorption line is spread over all the measurement points (taken over time with a single photodiode) and mathematical Fourier transform methods permits to determine the peak or dip position with much more accuracy. Applications: Food, beverage & dairy Agriculture Gas detection Environmental monitoring Security and defense   Cosmetics Textile Plastics Process control (Solar cells characterization, Chemical monitoring, Pharmaceutical manufacturing). ... And so many other